Title :
IDT 2011 Table of contents
Abstract :
The following topics are dealt with: NOC design; SOC design; analog design; analog test; layout impact; integrated circuit nanometer design; and voltage modeling.
Keywords :
analogue integrated circuits; integrated circuit layout; integrated circuit modelling; network-on-chip; NOC design; SOC design; analog design; analog test; integrated circuit nanometer design; layout impact; voltage modeling;
Conference_Titel :
Design and Test Workshop (IDT), 2011 IEEE 6th International
Conference_Location :
Beirut
Print_ISBN :
978-1-4673-0468-9
Electronic_ISBN :
2162-0601
DOI :
10.1109/IDT.2011.6123118
