Title :
Using spectral warping for instrumentation and measurements in mixed-signal testing
Author :
Demidenkol, S. ; Piuri, V.
Author_Institution :
Inst. of Inf. Sci. & Technol., Massey Univ., Palmerston North, New Zealand
Abstract :
Spectral warping (SW) is the digital signal processing (DSP) procedure of transforming an original digital sequence to a new one having special spectral properties: equally spaced samples of its DFT (Discrete Fourier Transform) are identical to the unequally-spaced frequency samples of DFT of the original sequence. The use of SW can open up new opportunities in test signal generation as well as in test response analysis for mixed signal circuits
Keywords :
automatic test pattern generation; built-in self test; digital filters; discrete Fourier transforms; integrated circuit testing; mixed analogue-digital integrated circuits; signal representation; spectral analysis; BIST; DSP procedure; all-pass digital filter cascade; discrete Fourier transform; discrete-time signal; equally spaced samples; fault models; mixed-signal testing; signal representation; spectral warping; test response analysis; test signal generation; unequally-spaced frequency samples; Built-in self-test; Circuit testing; Cybernetics; Digital signal processing; Discrete Fourier transforms; Frequency measurement; Instruments; Sampling methods; Sequences; Signal generators;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
Print_ISBN :
0-7803-5276-9
DOI :
10.1109/IMTC.1999.776085
