DocumentCode :
2933105
Title :
HP94000 multi-site mixed signal test development considerations
Author :
Jannesari, S.
Author_Institution :
Burr Brown Corp., Tucson, AZ, USA
Volume :
3
fYear :
1999
fDate :
1999
Firstpage :
1563
Abstract :
This paper describes the implementation of a quad site test solution on HP94000 Mixed Signal LSI Test system. The HP94K has multi site test capability meaning that, multiple components can be tested simultaneously in parallel provided there is enough test resources in the system. It also has the capability of parallel processing. With parallel processing capability, one can perform complex computations on previously collected data while new data in being collected into the capture memory therefore reducing test time. The test solution described in this paper is for Burr-Brown´s ADSI20I high dynamic range delta sigma modulator. Circuit design and layout considerations are paramount when considering a mixed signal multi site test solution on HP94K. The test solution must go through a vigorous capability study, to verify test repeatability not only on a single site basis but also between site to site
Keywords :
analogue-digital conversion; automatic testing; delta-sigma modulation; digital filters; frequency response; integrated circuit testing; mixed analogue-digital integrated circuits; parallel algorithms; transfer functions; ADC; FFT algorithm; HP94000 Mixed Signal LSI Test system; calibration; circuit layout; complex computations; decimation; digital low-pass filter; frequency response; high dynamic range delta sigma modulator; linear convolution; multi-site mixed signal test development; multiple components; parallel processing; quad site test solution; software control; test repeatability; test time reduction; transfer function; Circuit testing; Digital filters; Digital modulation; Dynamic range; Filtering; Large scale integration; Noise shaping; Parallel processing; Performance evaluation; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
ISSN :
1091-5281
Print_ISBN :
0-7803-5276-9
Type :
conf
DOI :
10.1109/IMTC.1999.776088
Filename :
776088
Link To Document :
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