Title :
Effect of Magnetic Recording Layer Thickness on Media Performance in CoCrPtO Perpendicular Media
Author :
Kwon, U. ; Jung, H. ; Kuo, M. ; Velu, E. ; Malhotra, S.S. ; Bertero, G. ; Sinclair, R.
Author_Institution :
Stanford Univ., Stanford
Abstract :
In this study, the effect of magnetic recording layer thickness on media performance in CoCrPtO perpendicular media was investigated. The thin films were reactively sputter-deposited on NiP-coated Al substrates. Ru/Ta was used as an interlayer and the total thickness of the synthetic antiferromagnetically-coupled SUL was 140 nm. The CoCrPtO layer thickness was varied from 2 to 27 nm. Saturation magnetization (Ms) of the CoCrPtO layer, obtained from a slope of saturation magnetization per unit area versus media thickness (tMAG), was 450 emu/cm3. The film orientation and microstructure were investigated by X-ray diffraction (XRD) and transmission electron microscopy (TEM). Polar magneto-optic Kerr effect (MOKE) magnetometer and vibrating sample magnetometer (VSM) were used to measure the magnetic properties. Recording performance was evaluated by using a spin-stand tester with a single-pole-type writer and a GMR reader.
Keywords :
Kerr magneto-optical effect; X-ray diffraction; antiferromagnetic materials; chromium compounds; cobalt compounds; crystal microstructure; magnetic thin films; magnetisation; perpendicular magnetic recording; ruthenium; soft magnetic materials; sputter deposition; tantalum; transmission electron microscopy; CoCrPtO; GMR reader; Ru-Ta; X-ray diffraction; film microstructure; film orientation; layer thickness; magnetic recording layer thickness; magnetic thin films; polar magneto-optic Kerr effect magnetometer; saturation magnetization; single-pole-type writer; size 2 nm to 27 nm; spin-stand tester; sputter deposition; transmission electron microscopy; vibrating sample magnetometer; Antiferromagnetic materials; Magnetic films; Magnetic recording; Magnetometers; Magnetooptic recording; Microstructure; Saturation magnetization; Sputtering; Substrates; X-ray diffraction;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.375419
