Title :
EBL thickness and transition parameter in perpendicular oxide media
Author :
Supper, N.F. ; Margulies, D.T. ; Ikeda, Y. ; Moser, A. ; Olson, T. ; Lengsfield, B. ; Berger, A.
Author_Institution :
Hitachi, San Jose
Abstract :
This paper investigates the effect of varying the exchange-break-layer thicknesses (leading to a change in intergranular exchange) on spectral rolloff and the transition parameter (a-parameter). The rolloff curves are obtained by measuring the amplitude of the fundamental harmonic peak at each written density. A systematic increase of the low frequency amplitude is observed as the EBL thickness decrease.
Keywords :
chromium compounds; cobalt compounds; exchange interactions (electron); magnetic thin films; magnetic transitions; perpendicular magnetic recording; platinum compounds; CoPtCrJkO; exchange-break-layer thicknesses; intergranular exchange; perpendicular oxide media; spectral rolloff; transition parameter; Curve fitting; Density measurement; Glass; Hard disks; Magnetic field measurement; Magnetic heads; Magnetic separation; Magnetization; Magnetometers; Perpendicular magnetic recording;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.375422
