Title :
Texture Induced Noise And Its Impact On System Performance
Author :
Lin, G.H. ; Xing, X. ; Johnson, K.E. ; Bertram, H.N.
Author_Institution :
IBM Storage System Division
Keywords :
Atomic force microscopy; Electronic switching systems; Magnetic noise; Rough surfaces; Substrates; Surface roughness; Surface structures; Surface texture; System performance; Transistors;
Conference_Titel :
Magnetic Recording Conference 1996. Magnetic Recording Media., Digests of the
Conference_Location :
Santa Clara, CA, USA
DOI :
10.1109/MRC.1996.658178
