Title :
Side Erasure Analysis in Perpendicular Recording Media Using Dynamic Read-Back Microscopy
Author :
Albert, C. ; Abarra, E.N. ; Choe, G.
Author_Institution :
MMC Technol., San Jose
Abstract :
A spin-stand level dynamic read-back microscopy (DRM) technique offers ease of use and full compatibility with standard media parametrics testing. We designed and implemented a DRM tester based on a LeCroy DDA5005 oscilloscope and a Guzik spin-stand. Using a DRM, we investigated the effect of magnetic exchange coupling on side erasure of CoCrPt-SiO PMR media. Exchange was controlled by varying the oxygen partial pressure during deposition. The paper show tracks after a progressive edge-trimming from the both sides using a low DC-negative erase current.
Keywords :
chromium alloys; cobalt alloys; exchange interactions (electron); magnetic heads; perpendicular magnetic recording; platinum alloys; scanning probe microscopy; silicon compounds; CoCrPt-SiO; DRM tester; Guzik spin-stand; LeCroy DDA5005 oscilloscope; PMR media; dynamic read-back microscopy; edge trimming; low DC-negative erase current; magnetic exchange coupling; oxygen partial pressure; parametrics testing; perpendicular recording media; side erasure analysis; Image resolution; Magnetic domains; Magnetic heads; Microscopy; Oscilloscopes; Perpendicular magnetic recording; Servomechanisms; Shape; Stability; Testing;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.375427
