DocumentCode
2933543
Title
Conduction abnormalities in the right ventricular outflow tract in Brugada syndrome detected body surface potential mapping
Author
Guillem, Maria S. ; Climent, Andreu M. ; Millet, José ; Berne, Paola ; Ramos, Rafael ; Brugada, Josep ; Brugada, Ramon
Author_Institution
BIO-ITACA, Univ. Politec. de Valencia, Valencia, Spain
fYear
2010
fDate
Aug. 31 2010-Sept. 4 2010
Firstpage
2537
Lastpage
2540
Abstract
Brugada syndrome (BrS) causes sudden death in patients with structurally normal hearts. Manifestation of BrS in the ECG is dynamical and most patients do not show unequivocal signs of the syndrome during ECG screening. We have obtained 67-lead body surface potential mapping recordings of 25 patients with BrS and analyzed their spatial distribution of surface potentials during ventricular activation. Six patients presented spontaneous type I ECGs during the recording. These patients showed non-dipolarities in isopotential maps at the right ventricular outflow tract (RVOT) region during the development of terminal R waves in right precordial leads. Same finding was observed in 95% of BrS patients not presenting a type I ECG. Conduction delay in the RVOT may be a consistent finding in BrS patients that can be identified by Body Surface Potential Mapping.
Keywords
bioelectric potentials; electrocardiography; medical disorders; patient diagnosis; 67-lead body surface potential mapping; Brugada syndrome; ECG screening; conduction abnormalities; conduction delay; right ventricular outflow tract; terminal R waves; type I ECG; Delay; Electric potential; Electrocardiography; Heart; Lead; Surface waves; Torso; Arrhythmias, Cardiac; Body Surface Potential Mapping; Brugada Syndrome; Bundle-Branch Block; Echocardiography; Electrodes; Electrophysiologic Techniques, Cardiac; Heart Conduction System; Heart Ventricles; Humans; Reproducibility of Results; Signal Processing, Computer-Assisted;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location
Buenos Aires
ISSN
1557-170X
Print_ISBN
978-1-4244-4123-5
Type
conf
DOI
10.1109/IEMBS.2010.5626869
Filename
5626869
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