Title :
Cooling load prediction through recurrent neural networks
Author :
Sakawa, M. ; Kato, K. ; Misaka, M. ; Ushiro, S.
Author_Institution :
Dept. of Ind. & Syst. Eng., Hiroshima Univ., Japan
Abstract :
In this paper, we focus on recurrent neural networks and investigate their applicability to some identification or prediction problems. After reviewing the well-known learning algorithms for recurrent neural networks, called back propagation through time (BPTT) and real-time recurrent learning (RTRL), we investigate their performance when applied to relatively small-scale problems and evaluate the computational complexity of them. Following these investigations, we apply the recurrent neural networks to large-scale cooling load prediction problems in a district heating and cooling system. However, the computational complexity is enormous and learning within practical time seems to be very difficult. For decreasing such difficulties, we propose a model that preserves output values observed within an appropriate period. Through a lot of numerical simulations, it is shown that the proposed model has an ability to learn long cycle time series within relatively short time.<>
Keywords :
computational complexity; cooling; district heating; learning (artificial intelligence); load forecasting; recurrent neural nets; space heating; BPTT; RTRL; back propagation through time; computational complexity; cooling system; district heating system; identification; large-scale cooling load prediction problems; learning algorithms; long cycle time series; prediction problems; real-time recurrent learning; recurrent neural networks; Computational complexity; Cooling; Feedforward neural networks; Heating; Large-scale systems; Neural networks; Neurofeedback; Output feedback; Recurrent neural networks; Systems engineering and theory;
Conference_Titel :
Fuzzy Systems, 1995. International Joint Conference of the Fourth IEEE International Conference on Fuzzy Systems and The Second International Fuzzy Engineering Symposium., Proceedings of 1995 IEEE Int
Conference_Location :
Yokohama, Japan
Print_ISBN :
0-7803-2461-7
DOI :
10.1109/FUZZY.1995.409713