DocumentCode :
2933773
Title :
A 1-Mb STT-MRAM with zero-array standby power and 1.5-ns quick wake-up by 8-b fine-grained power gating
Author :
Ohsawa, Takashi ; Ikeda, Shoji ; Hanyu, Takahiro ; Ohno, Hideo ; Endoh, Tetsuo
Author_Institution :
Center for Spintronics Integrated Syst., Tohoku Univ., Sendai, Japan
fYear :
2013
fDate :
26-29 May 2013
Firstpage :
80
Lastpage :
83
Abstract :
The power gating is one of the key technologies that reduce the operation power of STT-RAMs for enjoying their non-volatility. Especially, the number of memory cells whose supply voltages are simultaneously controlled in the power gating (grain size) is required to be as small as the bit-width in read and write for minimizing the operation power. For this ultra-fine-grained power gating scheme, we proposed a small power line (PL) driver that utilizes an NFET bootstrap circuit. It is found that the size of the macro using this PL driver is almost independent of the grain size with its write and read performance kept constant. Therefore, this PL driver combined with a small grain is shown to realize a nonvolatile embedded memory macro of fast read/write cycles, ultra-low operation power and zero array standby power with no leak path in the PL drivers.
Keywords :
MRAM devices; bootstrap circuits; 1-Mb STT-MRAM; 8-b fine-grained power gating; NFET bootstrap circuit; PL driver; fast read-write cycles; memory cells; nonvolatile embedded memory; read performance; small power line driver; time 8 ns; ultra-fine-grained power gating scheme; ultra-low operation power; write performance; zero-array standby power; Arrays; CMOS integrated circuits; Grain size; Logic gates; Switches; Switching circuits; STT-RAM; bootstrap circuit; power gating;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Memory Workshop (IMW), 2013 5th IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4673-6168-2
Type :
conf
DOI :
10.1109/IMW.2013.6582103
Filename :
6582103
Link To Document :
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