Title :
Deep submicron on-chip crosstalk [and ANN prediction]
Author :
Yang, Zemo ; Mourad, Samiha
Author_Institution :
S3 Inc., Santa Clara, CA, USA
Abstract :
In this paper, we study the effect of crosstalk using three deep submicron technologies. We start the experiment by comparing the different technologies. Then we concentrate on 0.18 μm technology to examine the effect of different parameters on the crosstalk voltage peak and circuit timing. The parameters of interest are the size of the driving and load device and the length of the coupled line. The results confirmed that finer technologies cause higher impact. The magnitude of crosstalk in 0.18 μm may be high enough to violate noise margin. Preliminary layout guidelines are deduced. To facilitate applying them to CAD tools, an ANN was used to predict crosstalk given data on the driver, the load and the length of the interconnect
Keywords :
SPICE; circuit layout CAD; crosstalk; equivalent circuits; integrated circuit interconnections; integrated circuit layout; integrated circuit modelling; neural nets; 0.18 micron; ANN network; CAD tools; HSPICE; IC design; circuit timing; coupled line length; crosstalk voltage peak; deep submicron on-chip crosstalk; different parameters effect; driving and load device size; equivalent circuit; interconnect length; layout guidelines; modelling; noise margin; signal interference; Couplings; Crosstalk; Driver circuits; Impedance; Integrated circuit interconnections; Propagation losses; Routing; Timing; Transmission lines; Voltage;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
Print_ISBN :
0-7803-5276-9
DOI :
10.1109/IMTC.1999.776129
