Title :
The sensitivity of a method to predict a capacitor´s frequency characteristic
Author :
Avramov-Zamurovic, Svetlana ; Koffman, Andrew D. ; Oldham, Nile M. ; Waltrip, Bryan C.
Author_Institution :
US Naval Acad., Annapolis, MD, USA
Abstract :
Several groups have worked on the characterization of four terminal-pair (4TP) capacitance standards at high frequencies. This paper describes a variation of the technique to predict a capacitor´s frequency characteristic. The method is sensitive to regression parameter selection and the paper gives a detailed analysis of the techniques used to calculate reasonable values for these parameters. The results of the analysis of the capacitor frequency characteristic prediction method´s sensitivity to exponent parameter variation have shown that this sensitivity is a major uncertainty component in the uncertainty analysis of NIST´s capacitance standard measurement system
Keywords :
capacitance measurement; capacitors; measurement standards; measurement uncertainty; NIST measurement system; capacitor frequency characteristic prediction; four terminal-pair capacitance standard; regression parameter selection; sensitivity; uncertainty analysis; Capacitance measurement; Capacitors; Circuits; Difference equations; Frequency measurement; Impedance measurement; NIST; Performance analysis; Performance evaluation; Regression analysis;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
Print_ISBN :
0-7803-5276-9
DOI :
10.1109/IMTC.1999.776136