Title :
Voltage-burden induced errors in the detection of bridge balance
Author :
Chen, T.P. ; Liu, L.X. ; Chua, H.A.
Author_Institution :
Nat. Measure. Centre, Singapore Productivity & Stand. Board, Singapore
Abstract :
The influence of voltage burden on the detection of bridge balance may be overlooked as people may simply believe that a null current represents a bridge balance. In this study, the influence is investigated, and the measures for minimising the influence are introduced. A method for determining both the resistance ratio and voltage burden is also proposed.
Keywords :
bridge circuits; calibration; electric resistance measurement; measurement errors; resistors; voltage measurement; Wheatstone bridge; ammeter voltage burden; bridge balance detection; null current; resistance measurement; resistance ratio; voltage-burden induced errors; Bridge circuits; Current measurement; Detectors; Electrical resistance measurement; Productivity; Standards Board; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.699800
