Title :
Noise in high-speed digital-to-analog converters
Author :
Bourgeois, P.-Y. ; Imaike, T. ; Goavec-Merou, G. ; Rubiola, E.
Author_Institution :
Time & Freq. Dept., Univ. of Franche-Comte, Besancon, France
Abstract :
We report on the measurement of phase noise of high speed analog to digital converters in a full digital measurement setup and for various development boards. The tested configurations ensures a Nyquist rate higher than 100 MHz suitable for conventional ultralow noise devices. Several analog to digital converters featuring a SNR higher than 140 dB enable the measurement of AM and PM noise with a background noise of -185 dBc (floor) and -160 dBc (flicker, 10 Hz off the carrier) using cross-correlation technique.
Keywords :
analogue-digital conversion; digital-analogue conversion; noise measurement; phase measurement; phase noise; AM noise measurement; Nyquist rate; PM noise measurement; SNR; analog to digital converter; cross-correlation technique; digital measurement setup; digital-to-analog converter; phase noise measurement; ultralownoise device; Analog-digital conversion; Field programmable gate arrays; Frequency measurement; Noise measurement; Phase measurement; Phase noise;
Conference_Titel :
Frequency Control Symposium & the European Frequency and Time Forum (FCS), 2015 Joint Conference of the IEEE International
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4799-8865-5
DOI :
10.1109/FCS.2015.7138932
