Title :
Ultrafast optical fiber polarization-mode dispersion measurement using wavelength scanning technique
Author :
Chowdhury, Dipakbin Q. ; Chen, Gang
Author_Institution :
Corning Inc., NY, USA
fDate :
25 Feb.-1 March 1996
Abstract :
Summary form only given. Jones matrix eigenanalysis provides the most direct and reliable polarization-mode dispersion (PMD) vs. wavelength measurement. However, wavelength scanning (WS) technique has also been commercially available for optical fiber PMD measurement. Here we use the WS technique for an ultrafast realtime measurement of arrival-time statistics and, hence, PMD.
Keywords :
eigenvalues and eigenfunctions; high-speed optical techniques; matrix algebra; optical fibre polarisation; optical fibre testing; optical scanners; statistical analysis; WS technique; arrival-time statistics; optical fiber PMD measurement; polarization-mode dispersion; ultrafast optical fiber polarization-mode dispersion measurement; ultrafast realtime measurement; wavelength measurement; wavelength scanning; wavelength scanning technique; Delay effects; Frequency; Optical fiber dispersion; Optical fiber polarization; Optical fibers; Personal digital assistants; Polarization mode dispersion; Statistics; Time measurement; Wavelength measurement;
Conference_Titel :
Optical Fiber Communications, 1996. OFC '96
Print_ISBN :
1-55752-422-X
DOI :
10.1109/OFC.1996.907720
