• DocumentCode
    2934440
  • Title

    Fatigue life prediction of flip-chips in terms of nonlinear behavior of solder and underfill

  • Author

    Zhengfang Qian ; Minfu Lu ; Sheng Liu

  • Author_Institution
    Electron. Packaging Lab., Wayne State Univ., Detroit, MI
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    141
  • Lastpage
    148
  • Abstract
    The nonlinear properties of eutectic solder and underfill FP4526 have been reported and incorporated into ABAQUS material model library for the fatigue life prediction of advanced electronic packages. The methods of unified constitutive modeling, separated constitutive modeling, and fatigue life prediction have been described and compared in detail. The nonlinear constitutive modeling of solder alloys and underfills plays an important role in the life prediction in terms of the correct calculation of inelastic strain range and inelastic strain energy density of hysteresis loop under various accelerated test conditions. Combined with unified constitutive modeling, strain-based approach of life prediction is recommended in this paper. The analyses performed in this report present valuable insights for the design of advanced flip-chip packages
  • Keywords
    encapsulation; fatigue; finite element analysis; flip-chip devices; integrated circuit modelling; integrated circuit packaging; life testing; ABAQUS material model library; accelerated test conditions; advanced electronic packages; eutectic solder; fatigue life prediction; flip-chip packages; hysteresis loop; inelastic strain energy density; inelastic strain range; nonlinear behavior; separated constitutive modeling; underfill; unified constitutive modeling; Capacitive sensors; Electronics packaging; Fatigue; Flip chip; Libraries; Performance analysis; Predictive models; Soldering; Temperature; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-5231-9
  • Type

    conf

  • DOI
    10.1109/ECTC.1999.776162
  • Filename
    776162