• DocumentCode
    2934496
  • Title

    Wrinkle feature-based skin age estimation scheme

  • Author

    Kim, Kyungrok ; Young-Hwan Choi ; Hwang, Eenjun

  • Author_Institution
    Sch. of Electr. Eng., Korea Univ., Seoul, South Korea
  • fYear
    2009
  • fDate
    June 28 2009-July 3 2009
  • Firstpage
    1222
  • Lastpage
    1225
  • Abstract
    With the rapid deployment of information technology and the availability of cheap yet high performance image capturing devices, new types of healthcare services such as self-diagnosis and treatment have become possible. Skin is the outer layer of the human body and has long attracted a great deal of attention, since its appearance conveys useful information on the health condition of the subject. In this paper, we propose a skin age estimation scheme based on its wrinkle features such as length, width and depth, which represents the physical condition of skin statistically and quantitatively. We collected wrinkle features and personal data from various subjects, including age and gender, and constructed the ground truth in consultation with dermatologists. For the estimation, we used a non-linear, multi-class SVM (support vector machine). Via extensive experiments on our prototype system, we show that our scheme achieves a reasonable accuracy.
  • Keywords
    feature extraction; health care; medical image processing; support vector machines; dermatologist; healthcare services; image capturing devices; information technology; multiclass support vector machine; patient treatment; self-diagnosis; skin age estimation scheme; wrinkle feature extraction; Availability; Face detection; Feature extraction; Fingerprint recognition; Humans; Image segmentation; Medical services; Skin; Support vector machine classification; Support vector machines; Health care; SVM classifier; skin age; wrinkle features;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia and Expo, 2009. ICME 2009. IEEE International Conference on
  • Conference_Location
    New York, NY
  • ISSN
    1945-7871
  • Print_ISBN
    978-1-4244-4290-4
  • Electronic_ISBN
    1945-7871
  • Type

    conf

  • DOI
    10.1109/ICME.2009.5202721
  • Filename
    5202721