Title :
Miniature trapped-ion frequency standard with 171Yb+
Author :
Schwindt, Peter D. D. ; Yuan-Yu Jau ; Partner, Heather L. ; Serkland, Darwin K. ; Ison, Aaron ; McCants, Andrew ; Winrow, Edward ; Prestage, John ; Kellogg, James ; Yu, Nan ; Boschen, C. Daniel ; Kosvin, Igor ; Mailloux, David ; Scherer, David ; Nelson, C
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
We describe the development and frequency instability measurements of a highly miniaturized, buffer gas cooled, trapped-ion atomic clock. The clock utilizes the 12.6 GHz hyperfine transition of the 171Yb+ ion. A custom-built 3 cm3 vacuum package containing the ion trap is integrated with other key elements of the atomic frequency standard, including a photo multiplier tube, miniaturized laser sources at 369 nm and 935 nm, a local oscillator, and control electronics. With the clock physics package assembled on a 10 cm × 15 cm breadboard, the long-term fractional frequency instability was measured to be 6 × 10-14 at 25 days of integration. Later, the clock physics package was further miniaturized, and the frequency instability was measured to be 2 × 10-11/τ1/2 at integration times up to 10,000 s.
Keywords :
assembling; atomic clocks; cooling; frequency standards; laser frequency stability; packaging; ytterbium; Yb; clock physics package assembling; control electronics; frequency 12.6 GHz; hyperfine transition; long-term fractional frequency instability measurement; miniature trapped-ion frequency standard; miniaturized buffer gas cooled trapped-ion atomic clock; miniaturized laser source; photomultiplier tube; time 25 day; vacuum packaging; wavelength 369 nm; wavelength 935 nm; Clocks; Ions; Laser stability; Masers; Measurement by laser beam; Microwave oscillators; Vertical cavity surface emitting lasers; atomic clock; trapped ions;
Conference_Titel :
Frequency Control Symposium & the European Frequency and Time Forum (FCS), 2015 Joint Conference of the IEEE International
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4799-8865-5
DOI :
10.1109/FCS.2015.7138951