DocumentCode
2934590
Title
An integrated manufacturing approach to chip packaging
Author
Pharand, Sylvain
Author_Institution
IBM Canada Ltd., Aeroport Bromont, Que., Canada
fYear
1999
fDate
1999
Firstpage
185
Lastpage
187
Abstract
This paper examines the considerations of an integrated manufacturing approach to substrate finishing and chip packaging. By performing critical substrate related processes such as plating, pin attach and test, the carriers are in a sense being prepared for assembly at the assembly house. Such close synergy between substrate processing and assembly translates into a real life understanding of carrier product specifications as it pertains to assembly sensitivity. In this paper, key characteristics of such an integrated approach are presented. Cost of manufacturability and quality aspects are discussed. Specifications for ceramic and plastic substrates are compared for both flip chip (C4) and wirebond assembly applications. Some examples of optimization case studies used to determine specification values are reviewed. Functional testing methods and capabilities for flip chip (C4) and wire bond products are described. Where applicable, aspects of substrate-assembly interactions within such optimisations and functional testing are addressed with respect to problem solving, analytical/engineering support and quality feedback
Keywords
ceramic packaging; flip-chip devices; integrated circuit manufacture; integrated circuit packaging; integrated circuit testing; microassembling; plastic packaging; production testing; quality control; substrates; C4 assembly applications; carrier product specifications; ceramic substrates; chip packaging; flip chip assembly applications; functional testing methods; integrated manufacturing approach; manufacturability cost; pin attach; plastic substrates; plating; quality aspects; quality feedback; substrate finishing; wirebond assembly applications; Assembly; Ceramics; Costs; Finishing; Flip chip; Packaging; Performance evaluation; Plastics; Pulp manufacturing; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
0-7803-5231-9
Type
conf
DOI
10.1109/ECTC.1999.776169
Filename
776169
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