DocumentCode :
2934786
Title :
Heat spreader attach: a microprocessor thermal solution
Author :
Starr, Orion ; Master, Raj N. ; Khan, Mohammad Zubair ; Tain, Alex ; Ding, D.H. ; Juwanda, Ahmad
Author_Institution :
Adv. Micro Devices Inc., Sunnyvale, CA, USA
fYear :
1999
fDate :
1999
Firstpage :
238
Lastpage :
242
Abstract :
AMD´s heat spreader attach process utilizes a thermally conductive silicone adhesive which can be quickly and easily dispensed and cured. The heat spreader attach assembly process eliminates the need for gross leak testing (a.k.a, bubble testing), an expensive and time consuming test and reduces the capital equipment required while increasing production capacity compared to the thermal grease assembly process. A novel feature of adding “corner supports” increases the mechanical and interfacial reliability by preventing the heat spreader from moving and thereby reducing the stresses on the die/adhesive and adhesive/heat spreader interfaces. The paper will discuss the heat spreader´s thermal performance advantage over the thermal grease/lid combination. It will also discuss the DOEs to establish a robust assembly process. Fixture force and location were varied to determine the effect on bond line thickness and to determine the process window. Reliability data will be presented which shows that the heat spreader attach process is capable of withstanding all applicable reliability tests
Keywords :
adhesives; heat sinks; integrated circuit reliability; microprocessor chips; silicones; thermal management (packaging); DOEs; bond line thickness; corner supports; heat spreader attach; interfacial reliability; mechanical reliability; microprocessor thermal solution; process window; production capacity; robust assembly process; thermally conductive silicone adhesive; Assembly; Costs; Fixtures; Heat sinks; Microprocessors; Packaging; Seals; Testing; Thermal conductivity; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
0-7803-5231-9
Type :
conf
DOI :
10.1109/ECTC.1999.776178
Filename :
776178
Link To Document :
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