DocumentCode :
2934938
Title :
Recording Performance & Process Tolerance Of Dual-stripe MR Heads
Author :
Yimin Guo ; Yimin Hsu ; Kochan Ju
Author_Institution :
Headway Technologies, Inc.
fYear :
1995
fDate :
10-12 July 1995
Keywords :
Degradation; Dielectrics; Fabrication; Harmonics suppression; Magnetic heads; Magnetic noise; Magnetic recording; Micromagnetics; Performance analysis; Process control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetic Recording Conference 1995. Magnetic Recording Heads., Digest of the
Conference_Location :
Pittsburgh, PA, USA
Type :
conf
DOI :
10.1109/MRC.1995.658242
Filename :
658242
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2934938
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