DocumentCode :
2934941
Title :
Simulating underfill flow for microelectronics packaging
Author :
Iwamoto, N. ; Nakagawa, M. ; Mustoe, G.G.W.
Author_Institution :
Johnson Matthey Electron. Inc., San Diego, CA, USA
fYear :
1999
fDate :
1999
Firstpage :
294
Lastpage :
301
Abstract :
Underfill flow simulation is not yet sophisticated enough to understand the microdynamics. Although capillary action generally drives the filling phenomenon, it is the underlying principles that govern the underfill performance properties that are in need of understanding. For instance, flow speed, filler settling, filler striation and voiding are all properties that require a mechanistic understanding in order to improve the materials. Although binder and filler effects are expected from a combination of surface energy and particle dynamics drivers, the simple identification of the problem does not instruct how to control these effects. In order to address these issues two types of dynamic modeling have been initiated to understand formulation constituent effects: molecular modeling and discrete element modeling. It has been the goal of this modeling effort to construct a basic model of underfill flow which includes particle, binder (or carrier) and surface effects
Keywords :
capillarity; flow simulation; integrated circuit packaging; modelling; surface energy; voids (solid); binder effects; capillary action; discrete element modeling; dynamic modeling; filler settling; filler striation; filler voiding; flow speed; microelectronics packaging; molecular modeling; particle effects; surface effects; underfill flow simulation; underfill performance properties; Atmospheric modeling; Atomic force microscopy; Chemical elements; Chemistry; Costs; Electronics packaging; Filling; Mechanical factors; Microelectronics; Physics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
0-7803-5231-9
Type :
conf
DOI :
10.1109/ECTC.1999.776188
Filename :
776188
Link To Document :
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