Title :
Frequency Losses Of Readback Efficiency In Thin Film Inductive Heads
Author :
Zhu, Jun ; Thayamballi, Pradeep
Author_Institution :
READ-RITE Corporation
Keywords :
Frequency measurement; Impedance measurement; Magnetic heads; Performance loss; Preamplifiers; Resonant frequency; Solid modeling; Transfer functions; Transistors; Transmission lines;
Conference_Titel :
Magnetic Recording Conference 1995. Magnetic Recording Heads., Digest of the
Conference_Location :
Pittsburgh, PA, USA
DOI :
10.1109/MRC.1995.658250