DocumentCode :
2935118
Title :
Nanoindentation And The Tribology Of Head-disk Interface Components
Author :
White, R.L. ; Schreck, E. ; Run-Han Wang
Author_Institution :
IBM Storage Systems Division
fYear :
1995
fDate :
10-12 July 1995
Keywords :
Contact resistance; Electric shock; Electrical resistance measurement; Lapping; Magnetic heads; Magnetic materials; Mechanical factors; Plastics; Transistors; Tribology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetic Recording Conference 1995. Magnetic Recording Heads., Digest of the
Conference_Location :
Pittsburgh, PA, USA
Type :
conf
DOI :
10.1109/MRC.1995.658254
Filename :
658254
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2935118
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