Title :
Electrical control of ballistic spin-dependent conductance through magneto-electric barriers in the 2D-electron gas of GaAs heterostructure
Author :
Tan, S. ; Jalil, M. ; Kumar, S. ; Teo, K. ; Zheng, Y. ; Liew, T.
Author_Institution :
DSI, Singapore
Abstract :
In this article, the method of resonant tunneling through a double-pair potential barrier to induce spin-polarized current in the 2D-electron gas (2DEG) of a high-electron-mobility-transistor (HEMT) heterostructure is discussed. The effect of electrical barriers which can be conveniently established by applying electrical voltage to the ferromagnetic gates of the HEMT device. The electrical potential could be utilized here to control not only the spin current, but also the charge current. The pre-requisite is symmetrical magnetic potential (Ay) must first be established along the 2DEG x-axis by magnetizing the ferromagnetic gates accordingly. Subsequent application of asymmetrical electric potential turns on spin current, while symmetrical potential turns off spin current. However, charge current persists even in the absence of spin current. Increasing the strength of the symmetrical electric potential switches off both charge and spin current.
Keywords :
III-V semiconductors; ballistic transport; electric potential; gallium arsenide; high electron mobility transistors; magnetoelectric effects; resonant tunnelling; semiconductor device models; spin polarised transport; two-dimensional electron gas; 2D-electron gas; 2DEG; GaAs; HEMT; asymmetrical electric potential; ballistic spin-dependent conductance; charge current; double-pair potential barrier; electrical voltage; ferromagnetic gates; high-electron-mobility-transistor; magneto-electric barriers; resonant tunneling; semiconductor heterostructure; spin-polarized current; symmetrical magnetic potential; Conducting materials; Electric potential; Electrons; Energy states; Gallium arsenide; HEMTs; Magnetic materials; Magnetic switching; Semiconductor materials; Switches;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.375622