DocumentCode :
2935397
Title :
Low-cost, high reliability flip-chip removal for multi-chip modules
Author :
Stalter, Kathleen A. ; Jackson, Raymond A. ; Linnell, David C.
Author_Institution :
Microelectron. Div., IBM Corp., Hopewell Junction, NY, USA
fYear :
1999
fDate :
1999
Firstpage :
446
Lastpage :
450
Abstract :
The prevalent trend to consolidate devices onto multi-chip modules due to electrical performance benefits and printed circuit board real-estate constraints drives the need to have a device replacement technology. The ability to remove and replace devices, for either defective conditions or upgrade level designs, while preserving the electrical integrity and reliability of the other components on the module at various stages of manufacture is essential. It is not a cost-effective option to discard the remaining expensive die or to scrap the fully assembled complex module. The process must also be able to be exercised easily in a development environment where resources are at a minimum, but the learning generated through the ability to perform such operations in-situ is imperative. With the emergence of OEM assembly vendors, this technique and process must also be simple, inexpensive and easy to use, as a company should not be required to invest large resources in remove and replace manufacturing operations
Keywords :
flip-chip devices; multichip modules; device replacement technology; electrical integrity; flip-chip removal; in situ process; multi-chip module; reliability; Assembly; Fabrication; Flip chip; Infrared heating; Integrated circuit interconnections; Manufacturing processes; Microelectronics; Printed circuits; Silicon; Size control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
0-7803-5231-9
Type :
conf
DOI :
10.1109/ECTC.1999.776213
Filename :
776213
Link To Document :
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