Title :
Microwave photoconductivity spectrometer
Author :
Longhai, Kuang ; Bo, Kuang
Abstract :
A new non-contact measuring technique, which uses a microwave field as the medium, is described. A new kind of microwave photoconductivity spectrometer has been developed, and is used for observing and measuring the photoconductive effect of AgCl, AgBr, CdS, etc. The advantage of this technique is that many characteristics of semiconductors, especially photoconductors can be studied rapidly and accurately. Also real time observation of conductivity variation is possible
Keywords :
II-VI semiconductors; cadmium compounds; electrical conductivity measurement; high-frequency effects; microwave measurement; microwave spectrometers; photoconductivity; semiconductor materials; silver compounds; AgBr; AgCl; CdS; conductivity variation; microwave field; microwave photoconductivity spectrometer; noncontact measuring technique; photoconductive effect; photoconductors; real time observation; semiconductors; Conductivity; Dielectric constant; Magnetic field measurement; Magnetic resonance; Microwave measurements; Microwave theory and techniques; Photoconducting devices; Photoconductivity; Resonant frequency; Spectroscopy;
Conference_Titel :
Millimeter Wave and Far Infrared Science and Technology, 1996. Proceedings., 4TH International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-3619-4
DOI :
10.1109/ICMWFT.1996.574882
