Ferromagnetism in Ti-Doped ZnO Nanoclusters above Room Temperature

Author

Antony, J. ; Sharma, A. ; Meyer, D. ; Nutting, J. ; Qiang, Y. ; McCready, D.E. ; Engelhard, M.

Author_Institution

Univ. of Idaho, Moscow

fYear

2006

fDate

8-12 May 2006

Firstpage

140

Lastpage

140

Abstract

ZnO is doped with different transition metal (TM) elements, to form diluted magnetic semiconductor (DMS). Ferromagnetic behavior above RT is observed when 5% of non-magnetic titanium is doped into ZnO nanoclusters. 5% Ti-doped ZnO nanoclusters are prepared at RT using a third generation cluster source that utilizes a combination of high-pressure magneto-sputtering and aggregation. Doped clusters are characterized using transmission electron microscopy (TEM), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and superconducting quantum interference device (SQUID). SQUID magnetometer measures magnetic properties of doped clusters at various temperatures (5 to 400 K). The coercivity, remanent magnetization and hysteresis loop of the clusters are measured.

Keywords

II-VI semiconductors; X-ray diffraction; X-ray photoelectron spectra; coercive force; ferromagnetic materials; magnetic hysteresis; nanostructured materials; nanotechnology; remanence; semimagnetic semiconductors; sputter deposition; titanium; transmission electron microscopy; wide band gap semiconductors; zinc compounds; SQUID magnetometer; TEM; X-ray diffraction; X-ray photoelectron spectroscopy; XPS; XRD; ZnO:Ti; aggregation; coercivity; diluted magnetic semiconductor; ferromagnetism; high-pressure magneto-sputtering; hysteresis loop; magnetic properties; nanoclusters; remanent magnetization; superconducting quantum interference device; temperature 5 K to 400 K; transition metal elements; transmission electron microscopy; Magnetic semiconductors; Photoelectron microscopy; SQUIDs; Superconducting magnets; Temperature; Titanium; Transmission electron microscopy; X-ray diffraction; X-ray scattering; Zinc oxide;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2006. INTERMAG 2006. IEEE International

Conference_Location

San Diego, CA

Print_ISBN

1-4244-1479-2

Type

conf

DOI

10.1109/INTMAG.2006.375640

Filename

4261574