Title :
Performance of Microchannel Plates with Al2O3 Ion Barrier Film after High-Temperature Degassing
Author :
Jiang, De-Long ; Wang, Xin ; Wu, Kui ; Tian, Jing-Quan
Author_Institution :
Sch. of Sci., Changchun Univ. of Sci. & Technol., Changchun, China
Abstract :
The ion barrier film of microchannel plate (MCP) plays a most important role in the third generation low-light level image intensifier to prevent the feedback of positive ions, protect the photocathode and prolong the operating life of image intensifier. In this paper, the influence of high-temperature degassing on the performances of the ion barrier film and the MCP itself were investigated by the experiments. The high-temperature degassing and the corresponding measurement system of MCP were shown, the detailed technology process was given, and the changes of the ion barrier film´s morphology and the MCP´s electrical performance after high-temperature degassing were compared. For a MCP with an ion barrier film, it was found that the electron gain decreased, the bulk resistance increased, the grain size of the ion barrier film increased and the dead-voltage decreased after high-temperature degassing.
Keywords :
aluminium compounds; microchannel plates; photocathodes; Al2O3; bulk resistance; dead-voltage; electron gain; grain size; high-temperature degassing; ion barrier film; microchannel plates; photocathodes; third generation low-light level image intensifier; Aluminum oxide; Cathodes; Electric variables measurement; Electrical resistance measurement; Feedback; Image generation; Image intensifiers; Microchannel; Morphology; Protection;
Conference_Titel :
Photonics and Optoelectronic (SOPO), 2010 Symposium on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4963-7
Electronic_ISBN :
978-1-4244-4964-4
DOI :
10.1109/SOPO.2010.5504064