Title :
High quality Fe films on semiconductor (001) germanium (Ge) substrate
Author :
Lou, J. ; Chen, L. ; Harris, V. ; Vittoria, C. ; Sun, N.
Author_Institution :
Northeastern Univ., Boston
Abstract :
Pure Fe films were grown on Ge substrate by using DC magnetron sputtering. The microstructure of the Fe films was investigated with XRD and AFM. Magnetic properties of the films were studied with vibrating sample magnetometer and field-sweep FMR spectrometer.
Keywords :
X-ray diffraction; atomic force microscopy; ferromagnetic materials; ferromagnetic resonance; iron; magnetic thin films; sputter deposition; AFM; DC magnetron sputtering; Fe; Ge; XRD; field-sweep FMR spectrometer; magnetic films; microstructure; semiconductor germanium substrate; vibrating sample magnetometer; Germanium; Iron; Magnetic films; Magnetic properties; Magnetic semiconductors; Microstructure; Semiconductor films; Sputtering; Substrates; X-ray scattering;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.375658
