DocumentCode
2935805
Title
High quality Fe films on semiconductor (001) germanium (Ge) substrate
Author
Lou, J. ; Chen, L. ; Harris, V. ; Vittoria, C. ; Sun, N.
Author_Institution
Northeastern Univ., Boston
fYear
2006
fDate
8-12 May 2006
Firstpage
158
Lastpage
158
Abstract
Pure Fe films were grown on Ge substrate by using DC magnetron sputtering. The microstructure of the Fe films was investigated with XRD and AFM. Magnetic properties of the films were studied with vibrating sample magnetometer and field-sweep FMR spectrometer.
Keywords
X-ray diffraction; atomic force microscopy; ferromagnetic materials; ferromagnetic resonance; iron; magnetic thin films; sputter deposition; AFM; DC magnetron sputtering; Fe; Ge; XRD; field-sweep FMR spectrometer; magnetic films; microstructure; semiconductor germanium substrate; vibrating sample magnetometer; Germanium; Iron; Magnetic films; Magnetic properties; Magnetic semiconductors; Microstructure; Semiconductor films; Sputtering; Substrates; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location
San Diego, CA
Print_ISBN
1-4244-1479-2
Type
conf
DOI
10.1109/INTMAG.2006.375658
Filename
4261592
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