• DocumentCode
    2935825
  • Title

    Room Temperature Study of the Magnetic Moment of Ultra-Thin Fe on GaAs(100) and InAs(100)

  • Author

    Laloe, J. ; Van Belle, F. ; Ionescu, A. ; Vaz, C. ; Tselepi, M. ; Wastlbauer, G. ; Dalgiesh, R. ; Langridge, S. ; Bland, J.

  • Author_Institution
    Univ. of Cambridge, Cambridge
  • fYear
    2006
  • fDate
    8-12 May 2006
  • Firstpage
    159
  • Lastpage
    159
  • Abstract
    Here we studied the two systems Fe/GaAs(100) and the closely related Fe/InAs(100)to determine the Fe magnetic moment as a function of thickness.Ultra-thin (0.4 -23 nm) Fe layers were epitaxially grown at RT in a UHV MBE chamber on GaAs(100) and InAs(100) substrates.The structural characterisation was performed ex-situ by high-resolution X-ray diffraction and reflectometry (XRR).Magnetic characterisation of the films was performed using vector magneto-optical Kerr effect (MOKE) measurements, polarized neutron reflectometry (PNR) and super-conducting quantum interference device (SQUID) measurements at RT.Although the reduction of the symmetry at the interface can lead to an enhancement of the total magnetic moment, this contribution seems recessive as compared to those arising from roughness or interdiffusion.
  • Keywords
    Kerr magneto-optical effect; X-ray diffraction; epitaxial growth; ferromagnetic materials; gallium arsenide; indium compounds; iron; magnetic moments; magnetic structure; magnetic thin films; semiconductor-metal boundaries; Fe-GaAs; Fe-InAs; GaAs; GaAs(100); InAs; InAs(100); epitaxial growth; high-resolution X-ray diffraction; high-resolution X-ray reflectometry; magnetic characterisation; magnetic moment; magneto-optical Kerr effect; polarized neutron reflectometry; room temperature; structural characterisation; superconducting quantum interference device; temperature 293 K to 298 K; thin magnetic film; Iron; Magnetic films; Magnetic moments; Molecular beam epitaxial growth; Optical films; Performance evaluation; Reflectometry; Temperature; Thickness measurement; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2006. INTERMAG 2006. IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-1479-2
  • Type

    conf

  • DOI
    10.1109/INTMAG.2006.375659
  • Filename
    4261593