DocumentCode
2935825
Title
Room Temperature Study of the Magnetic Moment of Ultra-Thin Fe on GaAs(100) and InAs(100)
Author
Laloe, J. ; Van Belle, F. ; Ionescu, A. ; Vaz, C. ; Tselepi, M. ; Wastlbauer, G. ; Dalgiesh, R. ; Langridge, S. ; Bland, J.
Author_Institution
Univ. of Cambridge, Cambridge
fYear
2006
fDate
8-12 May 2006
Firstpage
159
Lastpage
159
Abstract
Here we studied the two systems Fe/GaAs(100) and the closely related Fe/InAs(100)to determine the Fe magnetic moment as a function of thickness.Ultra-thin (0.4 -23 nm) Fe layers were epitaxially grown at RT in a UHV MBE chamber on GaAs(100) and InAs(100) substrates.The structural characterisation was performed ex-situ by high-resolution X-ray diffraction and reflectometry (XRR).Magnetic characterisation of the films was performed using vector magneto-optical Kerr effect (MOKE) measurements, polarized neutron reflectometry (PNR) and super-conducting quantum interference device (SQUID) measurements at RT.Although the reduction of the symmetry at the interface can lead to an enhancement of the total magnetic moment, this contribution seems recessive as compared to those arising from roughness or interdiffusion.
Keywords
Kerr magneto-optical effect; X-ray diffraction; epitaxial growth; ferromagnetic materials; gallium arsenide; indium compounds; iron; magnetic moments; magnetic structure; magnetic thin films; semiconductor-metal boundaries; Fe-GaAs; Fe-InAs; GaAs; GaAs(100); InAs; InAs(100); epitaxial growth; high-resolution X-ray diffraction; high-resolution X-ray reflectometry; magnetic characterisation; magnetic moment; magneto-optical Kerr effect; polarized neutron reflectometry; room temperature; structural characterisation; superconducting quantum interference device; temperature 293 K to 298 K; thin magnetic film; Iron; Magnetic films; Magnetic moments; Molecular beam epitaxial growth; Optical films; Performance evaluation; Reflectometry; Temperature; Thickness measurement; X-ray diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location
San Diego, CA
Print_ISBN
1-4244-1479-2
Type
conf
DOI
10.1109/INTMAG.2006.375659
Filename
4261593
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