• DocumentCode
    2935842
  • Title

    Influence of flux selection and underfill selection on the reliability of flip-chips on FR-4

  • Author

    Feustel, Frank ; Eckebracht, Andrea

  • Author_Institution
    Semicond. & Microsyst. Technol. Lab., Tech. Univ. Dresden, Germany
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    583
  • Lastpage
    588
  • Abstract
    Flip chip assembly is an attractive approach to further reduction of size and weight in electronic packaging. For cost-effective products, organic FR-4 substrates are used which require the application of underfill to ensure a sufficient long-term reliability. Especially, the combination of underfill and flux, which is necessary for soldering, can be regarded as main factor that determines the lifetime of flip chip modules. This paper focusses on methodologies to evaluate and to select fluxes and underfills for flip chip assembly. Three fluxes were selected from more than 15 materials with respect to robust wetting properties and inert behavior during subsequent underfilling. Seven underfills were selected from more than 20 materials with respect to fast flow speed and uniform flow profile. A large number of flip chip modules was completely assembled to evaluate the reliability of 21 flux-underfill combinations. Results of thermal cycle tests and humidity storage showed that the reliability dramatically reduced by inappropriate flux-underfill combinations. Moreover, the influence of two different solder mask designs was compared
  • Keywords
    flip-chip devices; integrated circuit reliability; reflow soldering; wetting; electronic packaging; flip-chip assembly; flux selection; humidity storage; mask design; organic FR-4 substrate; reflow soldering; reliability; thermal cycling; underfill selection; wetting; Assembly; Electronics packaging; Flip chip; Glass; Laboratories; Robustness; Semiconductor device reliability; Soldering; Substrates; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-5231-9
  • Type

    conf

  • DOI
    10.1109/ECTC.1999.776238
  • Filename
    776238