• DocumentCode
    2935856
  • Title

    Intervallic-wavelet analysis for electromagnetic scattering by thin-wire structures

  • Author

    Tong, M.S. ; Wan, G.C. ; Chen, L.

  • Author_Institution
    Dept. of Electron. Sci. & Technol., Tongji Univ., Shanghai, China
  • fYear
    2011
  • fDate
    3-8 July 2011
  • Firstpage
    1585
  • Lastpage
    1588
  • Abstract
    Electromagnetic (EM) scattering by curved thin-wire structures is solved with intervallic wavelets in the method of moments (MoM). The electrical field integral equation (EFIE) for curved thin-wire structures is formulated based on the generalized Pocklington´s integral equation and the unknown current is expanded using the intervallic Coifman father wavelets as basis functions. Since the Coifman wavelets (Coiflets) possess a unique feature, i.e. the vanishing moments which can yield a Dirac-δ-like sampling property, they are used to construct the intervallic wavelets. By using the intervallic wavelets in the MoM and performing a fast wavelet transform (FWT), sparse impedance matrices can be obtained and the drawbacks of dense matrices are overcome. A typical numerical example is presented to demonstrate the effectiveness of the intervallic-wavelet MoM.
  • Keywords
    electric field integral equations; electromagnetic wave scattering; matrix algebra; method of moments; wavelet transforms; EFIE; EM scattering; FWT; MoM; basis Dirac-δ-like sampling property; curved thin- wire structure; electrical field integral equation; electromagnetic scattering; fast wavelet transform; generalized Pocklington integral equation; intervallic Coifman father wavelet basis function; intervallic-wavelet analysis; method of moment; sparse impedance matrices; Impedance; Integral equations; Moment methods; Multiresolution analysis; Sparse matrices; Wavelet transforms; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation (APSURSI), 2011 IEEE International Symposium on
  • Conference_Location
    Spokane, WA
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4244-9562-7
  • Type

    conf

  • DOI
    10.1109/APS.2011.5996603
  • Filename
    5996603