DocumentCode :
2935972
Title :
CSP die shrink solution for memory devices [DRAMs]
Author :
Kim, Young G. ; Gamini, Nader ; Mitchell, Craig
fYear :
1999
fDate :
1999
Firstpage :
627
Lastpage :
637
Abstract :
The purpose of this study was to show the effectiveness of die shrink as a package solution for memory devices. In the case of the 8 mm×10 mm Direct Rambus DRAM device, about 350 dies can be obtained from a single 8-inch wafer. The 85% linear shrink (15% shrink in both x and y-directions) allows an additional 150 dies from the same size wafer. This simple calculation explains the importance of die shrink. There are two basic requirements for the die shrink package solution. First, the footprint of the new package must be the same as that of the earlier package because a mounting board with multiple devices on it can not be changed to accommodate the footprint change of single device. Second, the test socket for the new package must be the same or compatible with minimal modification because the delivery time and expense for new sockets for test and burn-in are significant. The solution is limited to the μBGA package only. A ball matrix was used
Keywords :
DRAM chips; ball grid arrays; chip scale packaging; μBGA package; CSP die shrink; DRAMs; ball matrix; footprint; memory devices; mounting board; package solution; test socket; Assembly; Bandwidth; Bonding; Chip scale packaging; Costs; Electronics packaging; Random access memory; Sockets; Testing; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
0-7803-5231-9
Type :
conf
DOI :
10.1109/ECTC.1999.776245
Filename :
776245
Link To Document :
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