DocumentCode
2936114
Title
Analysis of the performance of integrated inductors (fabricated in MCM-L technology) in RF amplifier applications
Author
Duffy, Maeve ; O´Reilly, Stephen ; O´Donnell, Terence ; O Mathuna, Sean Cian
Author_Institution
Nat. Microelectron. Res. Centre, PEI Technol., Cork, Ireland
fYear
1999
fDate
1-4 June 1999
Firstpage
668
Lastpage
675
Abstract
Research in integrated passive components is becoming more widespread, as the advantages of increased reliability, reduced cost and improved performance are recognised. The subject of this paper is the integration of inductor components in MCM-L technology for RF applications. A detailed analysis of the sensitivity of an RF amplifier to components of parasitic impedance associated with MCM-L integrated inductors is presented. SPICE circuit models are used for this purpose. The performance of a range of integrated test devices is compared with specifications for equivalent commercial devices. Inductance values ranging from 4.5-27.4 nH are produced, with Q-values of up to 100. Such performance is shown to be perfectly suited for the application of integrated inductors in RF amplifier circuits.
Keywords
Q-factor; SPICE; circuit reliability; circuit simulation; inductors; multichip modules; radiofrequency amplifiers; MCM-L technology; Q-values; RF amplifier applications; SPICE circuit models; inductance values; integrated inductors; parasitic impedance; reliability; sensitivity; Circuit testing; Costs; Impedance; Inductors; Integrated circuit reliability; Integrated circuit technology; Performance analysis; Radio frequency; Radiofrequency amplifiers; SPICE;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
Conference_Location
San Diego, CA, USA
ISSN
0569-5503
Print_ISBN
0-7803-5231-9
Type
conf
DOI
10.1109/ECTC.1999.776251
Filename
776251
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