Title : 
Oxide adhesion characteristic of lead frame copper alloys
         
        
            Author : 
Tomioka, Yoichi ; Miyake, Jun
         
        
            Author_Institution : 
Nippon Mining and Metals Co., Ltd.
         
        
        
        
        
        
            Keywords : 
Adhesives; Conductive films; Copper alloys; Delamination; Electromagnetic compatibility; Lead compounds; Plastic packaging; Reflow soldering; Substrates;
         
        
        
        
            Conference_Titel : 
Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
         
        
            Conference_Location : 
San Diego, CA, USA
         
        
        
            Print_ISBN : 
0-7803-5231-9
         
        
        
            DOI : 
10.1109/ECTC.1999.776258