Title :
Oxide adhesion characteristic of lead frame copper alloys
Author :
Tomioka, Yoichi ; Miyake, Jun
Author_Institution :
Nippon Mining and Metals Co., Ltd.
Keywords :
Adhesives; Conductive films; Copper alloys; Delamination; Electromagnetic compatibility; Lead compounds; Plastic packaging; Reflow soldering; Substrates;
Conference_Titel :
Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-5231-9
DOI :
10.1109/ECTC.1999.776258