• DocumentCode
    2936319
  • Title

    A transmission electron energy loss spectrometry study for the source of an anomalous positive exchange bias in a Ni80Fe20/NixFe1-xO thin-film bilayer

  • Author

    Ouyang, H. ; Lin, K. ; Liu, C. ; Tzeng, Y. ; Guo, Z. ; van Lierop, J.

  • Author_Institution
    Nat. Chung Hsing Univ., Taichung
  • fYear
    2006
  • fDate
    8-12 May 2006
  • Firstpage
    182
  • Lastpage
    182
  • Abstract
    In this paper, transmission electron energy loss spectrometry was used to explore the possible origins for an atypical temperature dependent positive exchange bias in a Ni80Fe20/NixFe1-xO thin-film when it is zero-field cooled that shows the usual negative exchange bias when it is field cooled.
  • Keywords
    electron energy loss spectra; exchange interactions (electron); ferromagnetic materials; interface magnetism; iron alloys; magnetic thin films; nickel alloys; nickel compounds; Ni80Fe20-NiFeO; anomalous positive exchange bias; dual ion-beam deposition technique; ferromagnetic film layer; negative exchange bias; thin-film bilayer; transmission electron energy loss spectrometry; zero-field cooling; Antiferromagnetic materials; Electrons; Energy loss; Extraterrestrial measurements; Iron; Magnetic hysteresis; Solids; Spectroscopy; Temperature dependence; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2006. INTERMAG 2006. IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-1479-2
  • Type

    conf

  • DOI
    10.1109/INTMAG.2006.375682
  • Filename
    4261616
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2936319