Title :
A transmission electron energy loss spectrometry study for the source of an anomalous positive exchange bias in a Ni80Fe20/NixFe1-xO thin-film bilayer
Author :
Ouyang, H. ; Lin, K. ; Liu, C. ; Tzeng, Y. ; Guo, Z. ; van Lierop, J.
Author_Institution :
Nat. Chung Hsing Univ., Taichung
Abstract :
In this paper, transmission electron energy loss spectrometry was used to explore the possible origins for an atypical temperature dependent positive exchange bias in a Ni80Fe20/NixFe1-xO thin-film when it is zero-field cooled that shows the usual negative exchange bias when it is field cooled.
Keywords :
electron energy loss spectra; exchange interactions (electron); ferromagnetic materials; interface magnetism; iron alloys; magnetic thin films; nickel alloys; nickel compounds; Ni80Fe20-NiFeO; anomalous positive exchange bias; dual ion-beam deposition technique; ferromagnetic film layer; negative exchange bias; thin-film bilayer; transmission electron energy loss spectrometry; zero-field cooling; Antiferromagnetic materials; Electrons; Energy loss; Extraterrestrial measurements; Iron; Magnetic hysteresis; Solids; Spectroscopy; Temperature dependence; Transistors;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.375682
