DocumentCode
2936523
Title
Optical patiern in nonlnear semiconductor microcavities
Author
Ganne, I. ; Slekys, G. ; Sagnes, I. ; Kuszelewicz, R.
fYear
2000
fDate
10-15 Sept. 2000
Firstpage
58
Keywords
automatic test pattern generation; logic CAD; logic testing; ATPG; CPU performance; advanced design techniques; circuit optimisation; digital logic techniques; fault simulation; floorplanning; intelligent memory; logic circuit families; logic optimisation; optimisation; parasitic modelling; partitioning; processor microarchitecture; Bismuth; Dispersion; Hysteresis; Large Hadron Collider; Microcavities; Nonlinear optics; Pulse modulation; Resonance; Shape control; Tuning;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics Conference, 2000. Conference Digest. 2000 International
Conference_Location
Nice, France
Print_ISBN
0-7803-6318-3
Type
conf
DOI
10.1109/IQEC.2000.907847
Filename
907847
Link To Document