DocumentCode :
2936523
Title :
Optical patiern in nonlnear semiconductor microcavities
Author :
Ganne, I. ; Slekys, G. ; Sagnes, I. ; Kuszelewicz, R.
fYear :
2000
fDate :
10-15 Sept. 2000
Firstpage :
58
Keywords :
automatic test pattern generation; logic CAD; logic testing; ATPG; CPU performance; advanced design techniques; circuit optimisation; digital logic techniques; fault simulation; floorplanning; intelligent memory; logic circuit families; logic optimisation; optimisation; parasitic modelling; partitioning; processor microarchitecture; Bismuth; Dispersion; Hysteresis; Large Hadron Collider; Microcavities; Nonlinear optics; Pulse modulation; Resonance; Shape control; Tuning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics Conference, 2000. Conference Digest. 2000 International
Conference_Location :
Nice, France
Print_ISBN :
0-7803-6318-3
Type :
conf
DOI :
10.1109/IQEC.2000.907847
Filename :
907847
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2936523
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