• DocumentCode
    2936543
  • Title

    Flip chip underfill flow characteristics and prediction

  • Author

    Fine, P. ; Cobb, B. ; Nguyen, L.

  • Author_Institution
    Nat. Semicond. Corp., Santa Clara, CA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    790
  • Lastpage
    796
  • Abstract
    This paper will present recent results on underfill flow characterization. With quartz test chips of different bump patterns (peripheral, full array, and mixed designs) flip chip bonded on organic laminates, the flow properties of a number of commercial and experimental underfills were recorded and analyzed. Flow time, filler settling, and air entrapment were three major features evaluated. Good flow can be described by three measurable parameters, namely: viscosity, contact angle and more importantly, filler size and distribution. Viscosity and contact angle are commonly used in Hele Shaw and Washburn models. These models, however, do not take into consideration the features of the fillers. In general, underfills with particles less than 5 μm exhibited faster and more uniform flow fronts than materials with larger particles. The best materials worked well with standoff heights between 50 and 75 μm, while the poorer flowing materials showed streaking, voiding and fingering. However, at gaps of 25 μm, nearly all the materials tested incurred pronounced and reproducible streaking
  • Keywords
    encapsulation; flip-chip devices; integrated circuit packaging; laminates; viscosity; 50 to 75 micron; air entrapment; bump patterns; contact angle; filler settling; filler size; fingering; flip chip underfill; flow characteristics; flow time; organic laminates; standoff heights; streaking; viscosity; voiding; Bonding; Flip chip; Fluid flow measurement; Laminates; Materials testing; Pattern analysis; Semiconductor device measurement; Size measurement; Video recording; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-5231-9
  • Type

    conf

  • DOI
    10.1109/ECTC.1999.776272
  • Filename
    776272