Title :
Overshoot and undershoot control for transmission line interconnects
Author :
Lee, Jaebum ; Shragowitz, Eugene
Author_Institution :
Hewlett-Packard Co., Santa Rosa, CA, USA
Abstract :
In this paper, properties of overshoot and undershoot as functions of circuit parameters are formally investigated. We identified existence conditions of overshoot and undershoot. Analytic solutions of overshoot and undershoot amplitudes by line length, termination, and rise time are derived. These analytic solutions have a form of two-piece linear dependence of these amplitudes on interconnect length. Simulation results for lossy pin-to-pin and daisy-chain interconnects demonstrated this dependence even with loss effects present. The role of interconnect length in the control of overshoot and undershoot at the physical design step is investigated
Keywords :
integrated circuit interconnections; integrated circuit packaging; losses; transmission line theory; amplitudes; circuit parameters; daisy-chain interconnects; line length; loss effects; lossy pin-to-pin interconnects; overshoot control; rise time; termination; transmission line interconnects; two-piece linear dependence; undershoot control; Circuit simulation; Distributed parameter circuits; Impedance; Integrated circuit interconnections; Laplace equations; Propagation losses; Reflection; Shape; Transmission lines; Voltage;
Conference_Titel :
Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-5231-9
DOI :
10.1109/ECTC.1999.776286
