Title :
Speckle-averaged resonant Rayleigh scattering from quantum well excitons
Author :
Hayes, G.R. ; Deveaud, B. ; Savona, Vincenzo ; Haacke, S.
Author_Institution :
Dept. of Phys., Swiss Fed. Inst. of Technol., Lausanne, Switzerland
Abstract :
Summary form only given. We have measured the ultrafast resonant Rayleigh scattering from quantum well excitons using Fourier transform spectral interferometry. Our novel approach enables us to simultaneously measure a statistically significant number of speckles with one hundred femtosecond temporal resolution. We show that theories based on ensemble-averaging can be compared directly with the experimental resonant Rayleigh scattering dynamics. We also deduce the importance of other contributions to the total secondary emission.
Keywords :
Fourier transform spectroscopy; Mach-Zehnder interferometers; Rayleigh scattering; excitons; semiconductor quantum wells; speckle; statistical analysis; Fourier transform spectral interferometry; Rayleigh scattering dynamics; ensemble-averagin; femtosecond temporal resolution; quantum well excitons; speckle-averaged resonant Rayleigh scattering; total secondary emission; ultrafast resonant Rayleigh scattering; Excitons; Laser theory; Optical scattering; Particle scattering; Physics; Rayleigh scattering; Resonance light scattering; Solitons; Ultrafast electronics; Ultrafast optics;
Conference_Titel :
Quantum Electronics Conference, 2000. Conference Digest. 2000 International
Conference_Location :
Nice, France
Print_ISBN :
0-7803-6318-3
DOI :
10.1109/IQEC.2000.907868
