• DocumentCode
    2937611
  • Title

    The effect of copper foil properties on low cycle fatigue of a multi-layer flex cable

  • Author

    Farquhar, Donald S. ; Niu, Tyan M. ; Keesler, Ross ; Bupp, James R.

  • Author_Institution
    IBM Microelectron., Endicott, NY, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1116
  • Lastpage
    1121
  • Abstract
    A multi-layer high performance flex cable was used as a test vehicle for studying the effect of copper foil properties on low cycle fatigue properties of fine line conductors. We fabricated the cable using copper foils for the three conductor layers, and used advanced organic composite dielectric materials for the internal dielectric layers. We fabricated the conductors using subtractive etching as opposed to using an additive plating process. The cable had to survive multiple cycles of fatigue bending around a sharp radius and we found that selection of copper foil was critical in determining fatigue life. We identified three distinct failure mechanisms in the cables that depended strongly on the surface roughness of the foil. We then studied the mechanical properties of free-standing copper foils of varying roughness and thickness to explain the behavior of the cables. We found that the surface roughness of the foils, and the ratio of roughness to thickness, strongly effected their fatigue performance
  • Keywords
    bending; cable testing; cables (electric); etching; fatigue; foils; surface topography; Cu; failure mechanisms; fatigue bending; fatigue life; fine line conductors; foil properties; internal dielectric layers; low cycle fatigue properties; multi-layer flex cable; organic composite dielectric materials; subtractive etching; surface roughness; test vehicle; Cables; Conducting materials; Copper; Dielectric materials; Etching; Fatigue; Rough surfaces; Surface roughness; Testing; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-5231-9
  • Type

    conf

  • DOI
    10.1109/ECTC.1999.776329
  • Filename
    776329