DocumentCode
2937713
Title
A fractional electrical impedance model in detection of occlusal non-cavitated carious
Author
Morais, Andréa P. ; Pino, Alexandre V. ; Souza, Márcio N.
Author_Institution
Biomed. Eng. Program - COPPE, Fed. Univ. of Rio de Janeiro, Rio de Janeiro, Brazil
fYear
2010
fDate
Aug. 31 2010-Sept. 4 2010
Firstpage
6551
Lastpage
6554
Abstract
Identification of occlusal caries remains a major concern for the diagnosis, which is still highly subjective and presents a considerable variability among clinicians. Dentists have been observed an increase of a specifically type of caries lesion, the hidden caries. Among the available techniques to assess the hidden caries, the measurement of electrical impedance has been shown to be one of the most promising. This paper presents a fractional electrical model for the tooth and uses such a model associated to a BioImpedance Spectroscopy (BIS) method based on the current response to a step voltage excitation. An analytical solution for the current response is presented based on a fractional calculus approach. Estimate parameters of the proposed model achieved using an in vitro data acquired in a protocol performed to collect bioimpedance data showed that it seems possible to detect occlusal non-cavitated caries, and that the principal confounding factor in the diagnosis of the incipient occlusal caries, the pigmented areas, can also be differentiated.
Keywords
bioelectric phenomena; biomedical measurement; calculus; dentistry; electric impedance measurement; patient diagnosis; biolmpedance spectroscopy; current response; fractional calculus; fractional electrical impedance model; hidden caries; occlusal noncavitated caries detection; step voltage excitation; tooth; Bioimpedance; Bioinformatics; Biological system modeling; Dentistry; Impedance; Lesions; Teeth; Dental Caries; Dental Caries Activity Tests; Electric Impedance; Humans;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location
Buenos Aires
ISSN
1557-170X
Print_ISBN
978-1-4244-4123-5
Type
conf
DOI
10.1109/IEMBS.2010.5627098
Filename
5627098
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