• DocumentCode
    2937858
  • Title

    A New Objective Evaluation Index to Fusion Images Quality Based on Power Spectrum and HVS Characteristics

  • Author

    Zhang, Yong ; Jin, Weiqi

  • Author_Institution
    Sch. of Inf. Sci. & Technol., Beijing Inst. Technol. Univ., Beijing, China
  • fYear
    2010
  • fDate
    19-21 June 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Compared with the subjective assessment method, the objective assessment method evaluate image quality by means of these criterion indexes such as average grads, standard deviation, spatial frequency, entropy, mutual information and so on. The limitation of these methods is only to analyze the images themselves, which lack the association with subjective factors. Proper introduce human visual system characteristics to image evaluation could improve the evaluation accuracy. Aiming at these reasons, a new evaluation index is introduced by means of the accumulation of different component of power spectrum fitting HVS characteristics. The method takes frequency domain information as the main structural information for the image and gets a frequency domain function of the image from weighted frequency components after a fast Fourier transform based on the human visual system with different sensitivities in the frequency domain. Experimental results show that this model is more consistent with the human visual system and can assess the image quality more precisely than others single factor assessment methods.
  • Keywords
    fast Fourier transforms; image fusion; HVS characteristics; fast Fourier transform; fusion images quality; human visual system; image evaluation; objective assessment method; objective evaluation index; power spectrum fitting; subjective assessment method; Entropy; Fast Fourier transforms; Frequency domain analysis; Humans; Image analysis; Image quality; Information science; Mechanical engineering; Mutual information; Visual system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics and Optoelectronic (SOPO), 2010 Symposium on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-4963-7
  • Electronic_ISBN
    978-1-4244-4964-4
  • Type

    conf

  • DOI
    10.1109/SOPO.2010.5504225
  • Filename
    5504225