• DocumentCode
    2937901
  • Title

    Hook Effect correction & resistance-based Cole fitting prior Cole model-based analysis: Experimental validation

  • Author

    Buendia, Rubén ; Seoane, Fernando ; Harris, Matthew ; Caffarel, Jennifer ; Gil, Roberto

  • Author_Institution
    Dept. of Theor. of the Signal & Commun., Univ. of Alcala, Alcalá de Henares, Spain
  • fYear
    2010
  • fDate
    Aug. 31 2010-Sept. 4 2010
  • Firstpage
    6563
  • Lastpage
    6566
  • Abstract
    The analysis of measurements of Electrical Bioimpedance (EBI) is on the increase for performing non-invasive assessment of health status and monitoring of pathophysiological mechanisms. EBI measurements might contain measurements artefacts that must be carefully removed prior to any further analysis. Cole model-based analysis is often selected when analysing EBI data and might lead to miss-conclusion if it is applied on data contaminated with measurement artefacts. The recently proposed Correction Function to eliminate the influence of the Hook Effect from EBI data and the fitting to the real part of the Cole model to extract the Cole parameters have been validated on experimental measurements. The obtained results confirm the feasible experimental use of these promising pre-processing tools that might improve the outcome of EBI applications using Cole model-based analysis.
  • Keywords
    bioelectric phenomena; electric impedance measurement; medical signal processing; patient diagnosis; patient monitoring; Cole model-based analysis; EBI data; Hook effect correction; electrical bioimpedance; health status; noninvasive assessment; pathophysiological mechanisms; patient monitoring; resistance-based Cole fitting; Bioimpedance; Data models; Electrical resistance measurement; Fitting; Frequency measurement; Impedance; Resistance; Animals; Electric Impedance; Humans;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
  • Conference_Location
    Buenos Aires
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4123-5
  • Type

    conf

  • DOI
    10.1109/IEMBS.2010.5627109
  • Filename
    5627109