• DocumentCode
    2937910
  • Title

    Comparison of the shielding effectiveness between two methods of cable bridge EMP protection

  • Author

    Su Liyuan ; Gao Chen ; Lu Feng

  • Author_Institution
    Nat. Key Lab. on Electromagn. Environ. Effects & Electro-Opt. Eng., PLA Univ. of Sci.&Tech., Nanjing, China
  • fYear
    2012
  • fDate
    6-9 Nov. 2012
  • Firstpage
    305
  • Lastpage
    308
  • Abstract
    EMP (electromagnetic pulse) has the characteristics of transience, wide spectrum, high intensity and etc. EMP brings severe threaten to the electrical equipments. And conducted interference is produced along the cables of the electrical equipments, which is an important coupling path. As the support of the cables, cable bridges provide electromagnetic shielding as well as cable laying support, which is significant to improve the conducted immunity of the electrical equipments. So it is important to design electromagnetic protection for cable bridges. In this paper, two kinds of electromagnetic hardening techniques are applied to a typical cable bridge on the joint, and the EMP shielding effectiveness of them are measured respectively to analysis the influence of the electromagnetic hardening on the EMP shielding effectiveness.
  • Keywords
    bridges (structures); cable laying; cable shielding; electromagnetic pulse; electromagnetic shielding; EMP shielding effectiveness; cable bridge EMP protection; cable bridges; cable laying support; conducted immunity; conducted interference; coupling path; electrical equipments; electromagnetic hardening techniques; electromagnetic protection; electromagnetic pulse; electromagnetic shielding; Antenna measurements; Bridges; Cable shielding; Electric fields; Electric variables measurement; Electromagnetic compatibility; Magnetic field measurement; cable bridges; electromagnetic protection; shielding effectiveness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environmental Electromagnetics (CEEM), 2012 6th Asia-Pacific Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4673-0030-8
  • Type

    conf

  • DOI
    10.1109/CEEM.2012.6410629
  • Filename
    6410629