Title : 
A study of temperature dependence of some relevant parameters performed on a set of CdTe detectors
         
        
            Author : 
Dusi, W. ; Caroli, E. ; Cocco, G. Di ; Donati, A. ; Landini, G. ; Chirco, P. ; Scannavini, M.G.
         
        
            Author_Institution : 
Istituto TE.S.R.E., CNR, Bologna, Italy
         
        
        
        
            fDate : 
30 Oct-5 Nov 1994
         
        
        
            Abstract : 
Cadmium telluride is a semiconductor material which is now widely used in both spectroscopic and imaging applications. Among its properties, the most advantageous is its ability to operate at room-temperatures, so as to avoid the need for bulk cooling devices. Nevertheless, a quantitative evaluation of the temperature dependance of the detectors response is needed in order to establish a temperature range for safe operation. In this paper, some parameters are evaluated at temperatures ranging from -35°C up to 40°C with an energy source of 511 keV for a set of three spectroscopy grade CdTe detectors. The data obtained seem to indicate a significant temperature independence below O°C, while at temperatures over 10°C spectra degradations occur
         
        
            Keywords : 
II-VI semiconductors; cadmium compounds; semiconductor counters; 10°C spectra degradations; 238 to 313 K; 511 keV; CdTe detectors; bulk cooling devices; imaging; room-temperature operation; safe operation; semiconductor; spectroscopy; spectroscopy grade CdTe detectors; temperature dependence; Astrophysics; Cadmium compounds; Detectors; Leak detection; Physics; Pulse amplifiers; Semiconductor materials; Spectroscopy; Temperature dependence; Temperature distribution;
         
        
        
        
            Conference_Titel : 
Nuclear Science Symposium and Medical Imaging Conference, 1994., 1994 IEEE Conference Record
         
        
            Conference_Location : 
Norfolk, VA
         
        
            Print_ISBN : 
0-7803-2544-3
         
        
        
            DOI : 
10.1109/NSSMIC.1994.474372