DocumentCode
2939363
Title
Application of fractal analysis to mammography
Author
Raguso, Grazia ; Ancona, Antonietta ; Chieppa, Loredana ; Abbate, Samuela L. ; Pepe, Maria Luisa ; Mangieri, Fabio ; Palo, Miriam De ; Rangayyan, Rangaraj M.
Author_Institution
Dept. of Math., Univ. of Bari, Bari, Italy
fYear
2010
fDate
Aug. 31 2010-Sept. 4 2010
Firstpage
3182
Lastpage
3185
Abstract
We report on a morphological study of 192 breast masses as seen in mammograms, with the aim of discrimination between benign masses and malignant tumors. From the contour of each mass, we computed the fractal dimension (FD) and a few shape factors, including compactness, fractional concavity, and spiculation index. We calculated FD using four different methods: the ruler and box-counting methods applied to each 2-dimensional (2D) contour and its 1-dimensional signature. The ANOVA test indicated statistically significant differences in the values of the various shape features between benign masses and malignant tumors. Analysis using receiver operating characteristics indicated the area under the curve, Az, of up to 0.92 with the individual shape features. The combination of compactness, FD with the 2D ruler method, and the spiculation index resulted in the highest Az value of 0.93.
Keywords
cancer; fractals; mammography; medical image processing; tumours; 1D signature; 2D contour; 2D ruler method; ANOVA test; benign masses; box-counting method; breast masses; compactness; fractal analysis; fractal dimension; fractional concavity; malignant tumors; mammography; shape factors; spiculation index; Benign tumors; Breast; Complexity theory; Fractals; Malignant tumors; Shape; Silicon; Algorithms; Artificial Intelligence; Breast Neoplasms; Female; Fractals; Humans; Mammography; Pattern Recognition, Automated; Radiographic Image Enhancement; Radiographic Image Interpretation, Computer-Assisted; Reproducibility of Results; Sensitivity and Specificity;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location
Buenos Aires
ISSN
1557-170X
Print_ISBN
978-1-4244-4123-5
Type
conf
DOI
10.1109/IEMBS.2010.5627180
Filename
5627180
Link To Document