Title :
Transition curvature analysis for high TPI applications
Author :
Che, X. ; Kim, N.
Author_Institution :
Samsung Inf. Syst. America, San Jose
Abstract :
This paper attempts to directly measure transition width and curvature based on a simple 2D transition model. The foundation of this approach is reciprocity principle and linear superposition of playback process.
Keywords :
perpendicular magnetic recording; 2D transition offtrack profile model; perpendicular recording; playback process linear superposition; reciprocity principle; transition width; Density measurement; Fabrication; Frequency; Information systems; Magnetic heads; Mathematical model; Metrology; Narrowband; Perpendicular magnetic recording; Spatial resolution;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.376071
