• DocumentCode
    2939578
  • Title

    Super and sub-critical Hopf bifurcation leading to chaos: theory and experiments

  • Author

    Larger, L. ; Erneux, T.

  • Author_Institution
    Lab. d´Opt., Univ. de Franche-Comte, Besancon, France
  • fYear
    2000
  • fDate
    10-15 Sept. 2000
  • Abstract
    Summary form only given. One of the simplest optical system exhibiting chaotic dynamics is Ikeda´s problem modeling a passive cavity subject to optical or optoelectronic feedback. But more recently, a variety of new optoelectronic chaos generators using a delayed feedback have been developed. As Ikeda´s system, these systems are accurately described by first order delay differential equations. The first dynamical instability corresponds to a Hopf bifurcation leading to time-periodic oscillations. If the bifurcation is super-critical, a smooth transition to oscillations is observed as the control parameter passes the Hopf bifurcation point. On the other hand, if the bifurcation is sub-critical, a hard transition to large amplitude oscillations can be expected.
  • Keywords
    bifurcation; cavity resonators; chaos generators; differential equations; optical chaos; optical feedback; optical resonators; oscillations; quantum optics; Hopf bifurcation; Ikeda´s problem; chaos; chaotic dynamics; control parameter; delayed feedback; experiments; first dynamical instability; first order delay differential equations; hard transition; large amplitude oscillations; optical feedback; optoelectronic chaos generators; optoelectronic feedback; oscillations; passive cavity; simplest optical system; smooth transition; sub-critical Hopf bifurcation; sub-critical bifurcation; super-critical Hopf bifurcation; super-critical bifurcation; theory; time-periodic oscillations; Atom optics; Bifurcation; Chaos; Delay; Lighting control; Nonlinear optics; Optical control; Optical coupling; Optical polarization; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics Conference, 2000. Conference Digest. 2000 International
  • Conference_Location
    Nice, France
  • Print_ISBN
    0-7803-6318-3
  • Type

    conf

  • DOI
    10.1109/IQEC.2000.908022
  • Filename
    908022